Read disturbance causes data corruption due to accumulated read cycles on the same page without a rewrite or erase of those cells. Over time, uncorrectable ECC errors may occur resulting in data loss. This error is very common in read-only applications without regular wear-leveled write operations. In order to circumvent this error, the NAND Flash product controller must utilize read disturb detection and avoidance technologies which automatically refresh the NAND before data corruption occurs. ATP’s AutoRefresh feature helps to nullify these read disturbance concerns. With ATP AutoRefresh, the controller automatically refreshes a portion of data blocks during power on. Furthermore, a percentage of write operations can be implemented into the host device usage model for additional risk aversion.